Test system

专利名称：Test system

发明人：Ki-Jae Song,Hun-Kyo Seo申请号：US12458008申请日：20090629

公开号：US20090322369A1公开日：20091231

专利附图：

摘要：A test system may include a test device, a switching unit and/or a test board.The test device may be configured to generate a first test signal swinging between a firstvoltage level and a second voltage level, and the first voltage level may be lower thanthe second voltage level. The switching unit may be coupled to the test device, and

configured to switch the first test signal to provide a second test signal swingingbetween a third voltage level and a fourth voltage level. The third voltage level may belower than the fourth voltage level. A plurality of devices under test (DUTs) may bemounted on the test board. Each of the plurality of DUTs may be connected in parallelwith respect to one another to the switching unit through a transmission line.

申请人：Ki-Jae Song,Hun-Kyo Seo

地址：Paju-si KR,Cheonan-si KR

国籍：KR,KR

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