专利名称：Methods and apparatus for improved fault
analysis
发明人：Aniruddh S. Dikhit,Joseph L. White申请号：US13852610申请日：20130328公开号：US09588834B1公开日：20170307
专利附图：
摘要：A method includes receiving a signal indicative of a value of a data pointassociated with a compute device at a first time. The value of the data point includes adata point category that is correlated with a fault category. The compute device is
operatively coupled to a record module having a protected mode and an unprotectedmode. A signal is received indicative of a value of the data point at a second time, afterthe first time. When a characteristic of a change in the value of the data point at the firsttime to value of the data point at the second time crosses a threshold in a first direction,a signal is sent to the record module indicative of an instruction to record data associatedwith the compute device in the protected mode to define a protected data set.
申请人：JUNIPER NETWORKS, INC.
地址：Sunnyvale CA US
国籍：US
代理机构：Cooley LLP
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